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About Us
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People
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Research
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Facilities
Impact
Impact

Facilities
Chip Design and Testing

The System on Chip Center focuses on the design of advanced electronic systems and is among the main pillars of the Artificial Intelligence Institute at Khalifa University. In SoCC, researchers and students are engaged in developments and design of low power hardware accelerators targeting AI, communication and security applications. This is achieved via the simulation, testing and characterization tools provided in SoCC lab. The lab has Industry standard IC CAD tools (Cadence, Synopsys, Mentor Graphics) to design at the advance technology node.  In addition, it has all the electrical characterization equipment’s needed to carry on device and board level testing including PCB board, and FPGA platforms.  In addition to circuits and systems, the SoCC has strong activities in the area of sensory development and microfluidic design for medical applications.

Some of the significant equipment under this facility are:

  • Network Analyzer for RF (67 and 111 GHZ)
  • Wire Bonding for packaging and PCB board
  • Signal Analyzer up to 40 GHZ
  • Oscilloscopes and Logic Analyzers (120 Gbs)
  • Power supplies and sensitive power measurements
  • A unique system for fabricating nano probes with sub-1 nm apex and one atom end

RRAM/Sensors/Microfluids Fabrication

In addition to chip design, SoCC cleanroom makes it possible for the center to innovate on novel devices through in-house microfabrication that demonstrates great potential in emerging memory technologies especially for medical and AI applications. Moreover, it facilitates developing new fabrication techniques to pattern conductive and transparent flexible electrodes. In addition, SoCC cleanroom enables researchers to develop microfluidic systems for separation and characterization of cancer cells from blood samples using an in-house developed microdevice.

Some of the significant equipment under this facility are:

  • DC Sputter
  • Spin coater
  • UV exposure system
  • Photolithography system (Dilase KLOE 650)
  • Metal Etchants

RRAM Electrical Characterization

In SoCC, researchers carry out electrical testing of emerging RRAM devices using the center’s probe stations and measurement instruments. Two stations are available; one places the device in ambient conditions, while the second probe station, places the device in a vacuum champer to simulate space environment. In both stations the temperature effect on devices behavior can be studied and analyzed by changing and controlling the temperature of the testing stage.

Some of the significant equipment under this facility are:

  • Keithley 4200A-SCS Parameter Analyzer: the highest performance parameter analyzer, providing synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.
  • Keithley 2400 Series SMU instrument: this instrument can concurrently source and measure current from 10 fA to 10 A pulse and/or voltage from 100 nV to 1100 V, for 1000 W pulse and 100 W DC total power.
  • Cryogenic Vacuum Probe Station: this probe station is able to perform a wide range of standard non-destructive measurements of electrical devices. It provides efficient operation and control of the cryogenic temperature with a continuous cooling system in a high vacuum (~ 10-6mbar) using either liquid helium or liquid nitrogen.