System-on-Chip Center


RRAM Electrical Characterization

In SoCL, researchers carry out electrical testing of emerging RRAM devices using the lab’s probe stations and measurement instruments. Two stations are available; one places the device in ambient conditions, while the second probe station places the device in a vacuum champer to simulate a space environment. In both stations, the temperature effect on devices behavior can be studied and analyzed by changing and controlling the temperature of the testing stage.

Some of the significant equipment under this facility are:

  • Keithley 4200A-SCS Parameter Analyzer: the highest performance parameter analyzer, providing synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.
  • Keithley 2400 Series SMU instrument: this instrument can concurrently source and measure current from 10 fA to 10 A pulse and/or voltage from 100 nV to 1100 V, for 1000 W pulse and 100 W DC total power.
  • Cryogenic Vacuum Probe Station: this probe station is able to perform a wide range of standard non-destructive measurements of electrical devices. It provides efficient operation and control of the cryogenic temperature with a continuous cooling system in a high vacuum (~ 10-6mbar) using either liquid helium or liquid nitrogen.