The Microscopy & Microanalysis (M&M) 2020 Conference is the biggest event in the field of Microscopy and this year it will be held in Milwaukee, Wisconsin from 2–6 August 2020. KU’s Dr. Dalaver H. Anjum, Assistant Professor of Physics, will host one of the conference’s symposiums, called “Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native States.”
The symposium will focus on devising new strategies to manipulate electron beams in advanced transmission electron microscopy (TEM) instruments for carrying out a nanoscale analysis of next-generation materials in their native state. New strategies are urgently needed because electron beams can alter the structure of materials if the electron dose is above the materials’ threshold level. Low-dose frame averaging, cryoTEM, electron detectors, and primary electron energies are a few examples of the parameters that are manipulated to devise new analysis strategies. Their applications cover various advanced materials including two-dimensional, biological, metal-organic framework, and zeolites.
Thus, the central message of the symposium will be to emphasize how TEM techniques (both cryoTEM and room temperature TEM) have become an indispensable tool for exploring the science and technology of next-generation materials.
Dr. Anjum will also be presenting his work in two other M&M 2020 symposia, including “Advances in Electron Microscopy to Characterize Materials Embedded in Devices” and “Crystallography at the Nanoscale and MicroED with Electrons and X-rays.” The two papers will focus on transmission microscopy analysis of semiconductors and metallic materials that have solar cell and aerospace applications.
16 March 2020