Single-atom and sub-1 nm probe for highly focused electron and ion beam microscopy and nano-probe microscopy.
Nano-probes are the most critical parts in all scanning probe microscopes, like atomic force microscopes and scanning tunneling microscopes, as the resolution of the microscope is a direct function of the probe apex size, where optimum resolution can be achieved by having extremely sharp probes. These atomically sharp nano-probes can be used for characterizing and manipulating, bio and chemical molecules, nanomaterials. In electron and ion microscopes like scanning electron microscope (SEM), and ultra-high resolution transmission electron microscope (UHTEM), nanoprobes
are used as a source of electrons and ions where highly focused electron and ion beams can be produced.
